Special Sessions

EMC Assessment and EMI Modelling for Electrical and
Electronic Devices in the Low-Frequency Range 

[Sponsored by TC-7]

Co-Chairs:
Erjon Ballukja and Karol Niewiadomski, University of Nottingham, UK

The increasing use of electrical and electronic devices may lead to electromagnetic interference (EMI) issues, especially within the low-frequency range. When dealing with electrical and electronic devices operating as standalone or within a network, electromagnetic compatibility (EMC) has to be considered. Indeed, each device should ensure EMC-compliant behaviour when used singularly and when operating within a network. In that regard, directives such as Directive 2014/30/EU, state that ‘‘devices working together in a network should operate without introducing interference which causes substantial degradation of service when used under normal operating conditions’’. Therefore, standards such as CISPR-16 should be met, when introducing a new device to the market.

The aim of this session is to provide ideas about EMC assessment measurements and techniques as well as about tackling EMI modelling issues, especially in the low-frequency range.

Advanced EMC Design Based on Near-field Modeling and Metasurface

Co-Chairs:
Richard Xian-Ke Gao, A*STAR Institute of High Performance Computing, Singapore
Xing-Chang Wei, Zhejiang University, China

The fast evolution of technologies in electronics, communication, wireless, material, artificial intelligence, and high performance computing provides better and more effective tools and solutions for scientific research and industry development. However, the electromagnetic environment and electromagnetic susceptibility of devices and systems become more complex and challenging than ever before. It demands innovations in the electromagnetic compatibility (EMC) design to tackle unwanted electromagnetic radiations and couplings in high-speed electronics and heterogeneous systems. This special session will address the scientific discoveries and cutting-edge technologies development in EMC by the invited researchers. The invited topics encompass but are not limited to modeling, simulation, and measurement by incorporating electromagnetic source reconstruction, metasurface and other advanced technologies to deal with the complicated electromagnetic interference (EMI) problems.

Stochastic Simulation for EMC and Signal Integrity

(Jointly Sponsored by TC-8 and TC-9)

Co-Chairs:
Paul Bremner, RobustPhysics, San Diego, CA
Prof. Zhen Peng, University of Illinois Urbana-Champaign, Urbana, IL

Many design challenges in EMC and Signal Integrity (SI) involve complexity and uncertainty that can only be quantified statistically. Reverberation chamber testing in EMC;  bit error rate (BER) metric for SI and RMS delay spread in 5G wireless are examples. Stochastic simulation has recently evolved to provide the model-based design tools for these applications – and more. 

While stochastic simulation can take the form of Monte-Carlo perturbations of deterministic full wave models, newer formulations have developed more compact, statistically-reduced order models (ROM) that incorporate physical parameter-based probability density function  models for the uncertainty bounds. These ROM models are typically based on wave physics or related basis functions that do not require numerical meshing. As a direct result, they solve orders of magnitude faster than full wave simulation; the predicted results are always a more realistic statistical distribution (eg. Max. Mean and Min.) and they offer a path forward for very high frequency applications at 100 GHz and beyond.